The predominance of a surface plane of high work function on Ti films
| dc.contributor.author | Kandasamy, K. | |
| dc.contributor.author | Surplice, N.A. | |
| dc.date.accessioned | 2022-09-26T08:51:24Z | |
| dc.date.available | 2022-09-26T08:51:24Z | |
| dc.date.issued | 1981 | |
| dc.description.abstract | The contact potential between clean Ti films and an Au reference surface have been determined by the Kelvin vibrating capacitor method. The majority of Ti films deposited on glass substrates had a high work function, which suggests that their surface was mainly (0001). Ti films on substrates of oxidised Ti had a much lower work function and probably had a surface of mainly (1011). | en_US |
| dc.identifier.issn | 00223719 | |
| dc.identifier.uri | http://repo.lib.jfn.ac.lk/ujrr/handle/123456789/8141 | |
| dc.language.iso | en | en_US |
| dc.publisher | Elsevier B.V. | en_US |
| dc.title | The predominance of a surface plane of high work function on Ti films | en_US |
| dc.type | Article | en_US |